Publications of the research group "Circuits of Birdsong"

Journal Article (6)

2024
Journal Article
Kornfeld, J.; Januszewski, M.; Schubert, P. J.; Jain, V.; Denk, W.; Fee, M. S.: An anatomical substrate of credit assignment in reinforcement learning. bioRxiv: the preprint server for biology (2024)
Journal Article
Schubert, P. J.; Saxena, R.; Kornfeld, J.: DeepFocus: Fast focus and astigmatism correction for electron microscopy. Nature Communications 15, 948 (2024)
2023
Journal Article
Sigmund, F.; Berezin, O.; Beliakova, S.; Magerl, B.; Drawitsch, M.; Piovesan, A.; Goncalves, F.; Bodea, S.-V.; Winkler, S.; Bousraou, Z. et al.; Grosshauser, M.; Samara, E.; Pujol-Marti, J.; Schadler, S.; So, C.; Irsen, S.; Walch, A.; Kofler, F.; Piraud, M.; Kornfeld, J.; Briggman, K.; Westmeyer, G. G.: Genetically encoded barcodes for correlative volume electron microscopy. Nature Biotechnology 41, pp. 1734 - 1745 (2023)
2022
Journal Article
Bonney, S. K.; Coelho-Santos, V.; Huang, S. F.; Takeno, M.; Kornfeld, J.; Keller, A.; Shih, A. Y. Y.: Public volume electron microscopy data: An essential resource to study the brain microvasculature. Frontiers in Cell and Developmental Biology 10, 849469 (2022)
Journal Article
Schubert, P. J.; Dorkenwald, S.; Januszewski, M.; Klimesch, J.; Svara, F. N.; Mancu, A.; Ahmad, H.; Fee, M. S.; Jain, V.; Kornfeld, J.: SyConn2: Dense synaptic connectivity inference for volume electron microscopy. Nature Methods 19, pp. 1367 - 1370 (2022)
Journal Article
Svara, F. N.; Förster, D.; Kubo, F.; Januszewski, M.; Dal Maschio, M.; Schubert, P. J.; Kornfeld, J.; Wanner, A. A.; Laurell, E.; Denk, W. et al.; Baier, H.: Automated synapse-level reconstruction of neural circuits in the larval zebrafish brain. Nature Methods 19 (11), pp. 1357 - 1366 (2022)

Conference Paper (1)

2024
Conference Paper
Mancu, A.; Laurent, T.; Rieger, F.; Arcaini, P.; Ishikawa, F.; Rueckert, D.: More is not always better: Exploring early repair of DNNs. In: Proceedings of the 5th IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, pp. 13 - 16 (Ed. IEEE). DeepTest '24, Lisbon, April 14, 2024 - April 20, 2024. Association for Computing Machinery (2024)
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